15 December 2011
AMS Technologies has unveiled a new spectrometer using a combination of a KTa1-xNbxO3 (KTN) optical beam scanner and a wavelength dispersion element.
This spectrometer can measure a wide optical spectrum in microsecond-order time because of the fast scan response of KTN optical beam scanner. The spectrometer will be used to measure microsecond optical pulses. The KTN scanner is expected to observe ultrafast luminous phenomena. This is because the Japanese company and AMS Technologies' partner, NTT-AT, successfully assembled a KTN scanner as a compact module with a fibre pigtailing. The module is 20 x 30 x 60mm in size. The temperature of the KTN scanner chip is controlled by TEC. The scanning angle is 10 degrees (±5 degrees) and the response speed is less than 1 micro second.