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Jenoptik will be exhibiting product innovations that ensure greater efficiency and precision, especially in the semiconductor industry, medical technology and laser material processing. 

In addition to displaying new lenses and beam expanders, Jenoptik will be demonstrating its JENvelt optical system for laser materials processing, which brings together a 2D Galvo Scanner, F-Theta lens and camera with integrated image processing and intelligent software.

Jenoptik’s UFO Probe Card, an intelligent test solution for PIC wafer testing, will also be on display. This card offers wafer manufacturers and wafer test equipment providers a time-saving and yield-enhancing solution for synchronous testing of electronic and photonic components – all with a single test card.