Analysis, test and measurement

ZeGage Plus

The ZeGage Plus optical profiler, a full-featured instrument for the 3D measurement of surface topography and roughness has been announced by Zygo Corporation

CinCam CMOS Pico

Cinogy Technologies has extended its CinCam CMOS line of laser beam profilers with the addition of the CMOS Pico

H13126 PMT module

A new photomultiplier tube module that offers wide dynamic range for applications such as chemiluminescence measurement and semiconductor inspection has been developed by Hamamatsu Photonics

AccuFiz Fizeau

4D Technology Corporation, manufacturer of optical metrology systems, has introduced its newly improved AccuFiz compact laser interferometer for accurate, repeatable measurement of surface shape and transmitted wavefront quality

Atomic Force Microscopy

Laser Components' partner Optometrics Corporation recently added advanced scanning Atomic Force Microscopy (AFM) within their metrology capabilities, enabling new benchmarks for nano-scale measurement, characterisation, and manipulation for diffraction gr


4D Technology Corporation, manufacturer of optical metrology systems, has introduced the FlexCam metrology module

S mart

Sensofar Metrology has released a new high-resolution 3D optical sensor system, the S mart. The new system is ideally suited for integration into automated production systems, in particular for inline process measurement and process control tasks

Zeiss O-Select

The new Zeiss O-Select optical measuring system closes gaps in the quality assurance process. Thanks to its high level of automation and ease of use, 2D measurements can be completed quickly and reproducibly

Gray laser power detectors

greenTEG has launched a new product line for high-precision laser power measurements.This novel gRAY laser power detectors enable broadband wavelength independent measurements in the ultra-violet through visible and out to the mid-infrared range


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