Analysis, test and measurement

SP1500 C interferometers

Designed for high-precision length, angle and straightness measurements of linear axes, new SP1500 C interferometers with a measuring range of >15m are now available in the UK through Armstrong Optical

ZeGage Plus

The ZeGage Plus optical profiler, a full-featured instrument for the 3D measurement of surface topography and roughness has been announced by Zygo Corporation

CinCam CMOS Pico

Cinogy Technologies has extended its CinCam CMOS line of laser beam profilers with the addition of the CMOS Pico

H13126 PMT module

A new photomultiplier tube module that offers wide dynamic range for applications such as chemiluminescence measurement and semiconductor inspection has been developed by Hamamatsu Photonics

AccuFiz Fizeau

4D Technology Corporation, manufacturer of optical metrology systems, has introduced its newly improved AccuFiz compact laser interferometer for accurate, repeatable measurement of surface shape and transmitted wavefront quality

Atomic Force Microscopy

Laser Components' partner Optometrics Corporation recently added advanced scanning Atomic Force Microscopy (AFM) within their metrology capabilities, enabling new benchmarks for nano-scale measurement, characterisation, and manipulation for diffraction gr


4D Technology Corporation, manufacturer of optical metrology systems, has introduced the FlexCam metrology module

S mart

Sensofar Metrology has released a new high-resolution 3D optical sensor system, the S mart. The new system is ideally suited for integration into automated production systems, in particular for inline process measurement and process control tasks

Zeiss O-Select

The new Zeiss O-Select optical measuring system closes gaps in the quality assurance process. Thanks to its high level of automation and ease of use, 2D measurements can be completed quickly and reproducibly


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