Microscopy

BX3M series

The new modular BX3M series of upright microscopes from Olympus can be customised to suit any requirement, from a cost-effective workhorse to a high-end research system

nVia Qontor

Renishaw has released the inVia Qontor Raman microscope with LiveTrack focus tracking technology, enabling users to analyse samples with uneven, curved or rough surfaces.

FB201

Prior Scientific has announced the FB201 co-axial coarse and fine focusing block, designed for OEM microscopy applications where precise fine focus adjustment is required

Vutara 352

Bruker has released the first quantitative super-resolution microscope, the Vutara 352, which offers speed, imaging depth, resolution, as well as real-time quantitative capabilities

OptiScan III

Prior Scientific has introduced the OptiScan III, a powerful, entry level system for controlling the OptiScan range of motorised microscope stages and focusing devices

Olympus SD-OSR

Featuring both confocal and super-resolution modes, the new Olympus SD-OSR microscope system has been launched

Super-resolution microscopy with a lighter touch

Super-resolution microscopy techniques have pushed the resolving power of light microscopes, but the methods can also cause photobleaching. Andy Extance discusses how scientific institutions and super-resolution companies are tackling this challenge

PInano

Physik Instrumente (PI) has introduced a new PInano super resolution (SR) microscope stage series, available in two variations: high precision with piezoresistive position feedback sensors, and high precision with high stability based on capacitive feedba

Leica DM4 P

Leica Microsystems has launched the Leica DM4 P polarisation microscope for the investigation of crystalline structures such as minerals, plastics and polymers, drugs and pharmaceuticals, or pigments and cement

Leica DM4 M and Leica DM6 M

The Leica DM4 M and Leica DM6 M upright microscopes for materials investigation have been introduced by Leica Microsystems. Both instruments have been designed for imaging, measurement, and analysis of similar features across many samples and materials

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