McPherson has introduced its Model 2061 high resolution spectrometer for emission, luminescence, Raman (strained silicon), and high temperature plasma spectra, measuring spectra to better than 0.02nm full width half maximum. The spectrometer is available for scanning and imaging applications via two-dimensional CCD or CMOS detectors. The one-metre focal length spectrometer features bilaterally adjustable slits, multiple entrance and exit port locations, and a high-precision wavelength drive to increase reproducibility. The spectrometer is designed to allow users to mount large, high angle Echelle type diffraction gratings, and its 50mm-wide focal plane is readily accessible.
Oversize McPherson snap-in gratings fitting the Model 2061 spectrometer provide 40 per cent more diffractive ruled area than predecessors. Matching, focusing and collimating optics provide excellent light throughput and operation with f/7 aperture. Many diffraction gratings are available to tailor systems for a wide-spectral range or desired spectral resolution. Spectral resolution with a 10µm entrance slit and a 1200g/mm grating is better than 0.02nm full width half maximum.