Park systems has released the XE-7 Atomic Force Microscope. The device has independent, loop XY and Z flexure scanners for sample and probe tip and has flat and orthogonal XY scan with low residual bow. The out of plane motion is less than 2nm over the entire scan range.
The microscope has less tip wear for prolonged high-quality and high-resolution imaging. It is also immune from parameter-dependent results observed in tapping imaging. A large range of SPM modes and sample measurement options exist.
The design consists of open side access for easy sample or tip exchange and intuitive laser alignment with pre-aligned tip mount. The head is easy to remove by the dovetail-lock mount. Also, direct on-axis optics are suitable for high resolution optical viewing.