Yokogawa releases optical spectrum analyser
The Yokogawa AQ6380 OSA offers high optical performance to allow engineers and scientists to develop and improve the speed, bandwidth and quality of the next generation of communication networks
The Yokogawa AQ6380 OSA offers high optical performance to allow engineers and scientists to develop and improve the speed, bandwidth and quality of the next generation of communication networks
The AQ2200-232 is a new high-performance optical sensor head that joins Yokogawa’s existing family of optical power meters modules (AQ2200-215 and AQ2200-221) in the company’s modular optical test platform
The new AQ6374 is the successor to the Yokogawa and Ando AQ6315A wideband optical spectrum analyser. Featuring diffraction grating based monochromator technology delivering high-precision measurement performance and accuracy, an enhanced user interface and an air purging feature, the new instrument offers engineers a powerful benchtop tool for general-purpose optical spectrum measurements over the wavelength range from 350 to 1,750nm.
Yokogawa has launched its AQ6376 Optical Spectrum Analyser (OSA), for measuring signals with a wavelength beyond 3 microns, designed to operate in the short-wavelength infrared (SWIR) as well as in the mid-wavelength infrared (MWIR) regions
Yokogawa's new AQ6375B is an optical spectrum analyser operating in the short-wavelength infrared (SWIR) region covering wavelengths from 1200 to 2400 nm
Yokogawa has introduced a new version of its successful AQ6373 optical spectrum analyser incorporating a new monochromator with a sharp passband filter edge plus a number of new features including a double-speed measuring mode, a multipeak/bottom search f
Yokogawa has introduced its AQ6370D benchtop optical spectrum analyser, which incorporates a number of new functions designed to enhance its accuracy and analysis capabilities in the 600-1,700nm wavelength range
Yokogawa has extended its range of plug-in modules for use with its AQ2200 series multi-application optical test system by introducing two new tunable light source modules that allow the test wavelength to be varied to suit the user’s application
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