Precitec Optronik has appointed Armstrong Optical as a distributor for its range of 3D surface profiling systems and sensors for thickness measurement.
Precitec Optronik has become well established in the marketplace and offers a range of sensor systems using the chromatic confocal technique for both non-contact profiling and thickness measurement. While normally using white light, Precitec Optronik has extended the range of measurements available by introducing near-IR light sources. This now allows the thickness of such materials as silicon and gallium arsenide (commonly used as semiconductor substrates) to be easily measured.
The sensor systems are available as either OEM units that can be integrated into machine tools to measure such features as glass thickness and shape, or as standalone 3D measuring instruments for off-line topographic and measurement studies.