PRESS RELEASE

NanoScan Beam Profiler

Photon has improved its NanoScan Beam Profiler so that it can now measure and report the actual frequency of a laser. Often the pulse frequency is unknown or is not exactly as specified by the manufacturer. Knowing the exact frequency allows the NanoScan to provide a more stable and accurate profile.

The NanoScan employs the scanning slit beam profiling technique, which provides higher accuracy and resolution than is possible with typical camera-type profilers. The pulsed measurement capabilities of the NanoScan: high-resolution beam size, beam position, and beam profile measurements can be performed on pulsed lasers operating at 1kHz or higher repetition rate.

Photon offers the pulsed measurement option standard with every one of its NanoScan models. This includes the NanoScan with silicon detector for operation at 350-1000nm wavelengths, the NanoScan with germanium detector for 700-1800nm wavelengths, and the NanoScan with pyroelectric detector for 190nm-20µm wavelengths at beam powers up to 1kWatt at certain wavelengths. The NanoScan can accurately measure continuous wave beams as small as 4µm and as large as 20mm. Minimum beam sizes for pulsed beams are dependent on the pulse frequency. The system includes a power measurement window with most models such that beam size, beam position, beam profile, and beam power can be generated in a single measurement.

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