PRESS RELEASE

Thin Film Measurement System

StellarNet has launched a low-cost line of non-contact thin film measurement systems that come complete with the necessary instrumentation and sofware. The supporting software includes a large library of materials data to support multilayer (up to 5+), freestanding, rough, and both thick and thin layer structures.

Thickness and optical constants (n, k) can be measured quickly and easily using reflectance and/or transmittance spectroscopy with analysis provided in just seconds. With USB2 connectivity, the powerful and user-friendly TFCompanion software provides complex measurements via user configurable measurement recipes. Supported parameterised materials include Cauchy, Sellmeir, EMA (effective-medium approximation), Harmonic oscillator, Tauc-Lorentz oscillator, Drude-Lorentz, and many more.

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