ICFO spin-off shinephi launches interferometric imaging method for semiconductor manufacturing

shinephi launch team (l-r): Silvia Carrasco, Vice Director of Innovation, Sponsored Research and Public Engagement at ICFO; Professor Valerio Pruneri from ICREA; Roland Terborg, CEO of shinephi; Iris Cusini, CTO of shinehphi; and Pola Emilià, Executive Director at ICREA (Image: ICFO)
Laterial-shear interferometric microscopy offers real-time, sub-nanometre imaging, says shinephi, meeting the precise needs of nanofabrication
Register for FREE to keep reading
Join 15,000+ photonics professionals staying ahead with:
- Exclusive insights, funding alerts & market trends
- Curated newsletters and digital editions
- Access to The Photonics100 list of R&D champions
- Exclusive panels & roundtables for professional development
- Technical White Papers & product updates to guide smarter decisions
Sign up now
Already a member? Log in here
Your data is protected under our privacy policy.
