S Neox optical profiler
Sensofar Metrology has released the fifth generation of its optical profiler
Sensofar Metrology has released the fifth generation of its optical profiler
Sensofar Metrology (booth 3404) will demonstrate its 3rd generation non-contact 3D optical profiler microscope system, the S neox, which has been purposely-designed for sub-nano, nano and micro-scale measurement, with advanced inspection and analysis capabilities.
The new S neox outperforms its predecessor in terms of design, functionality, efficiency and performance. But above all, the most impressive feature to highlight is the speed. It is faster than the previous S neox and is also faster than existing optical profilers.
Keely Portway looks at some of the latest advances in light-based test and measurement techniques
Sensofar Metrology has announced the Five Axis, a new 3D optical profiler that combines a high-accuracy rotational module and a high-resolution translation platform, together with advanced inspection and analysis capabilities
Sensofar Metrology has released a new high-speed non-contact 3D surface sensor, the S onix
Sensofar Metrology has released a new high-resolution non-contact 3D surface profiler in a more compact format - the S lynx
Sensofar Metrology has released a new high-resolution 3D optical sensor system, the S mart. The new system is ideally suited for integration into automated production systems, in particular for inline process measurement and process control tasks