S Neox optical profiler
4 July 2019
Sensofar Metrology has released the fifth generation of its optical profiler
Sensofar Metrology
Sensofar Metrology
Sensofar Metrology (booth 3404) will demonstrate its 3rd generation non-contact 3D optical profiler microscope system, the S neox, which has been purposely-designed for sub-nano, nano and micro-scale measurement, with advanced inspection and analysis capabilities.
The new S neox outperforms its predecessor in terms of design, functionality, efficiency and performance. But above all, the most impressive feature to highlight is the speed. It is faster than the previous S neox and is also faster than existing optical profilers.
Measure for measure
10 December 2018
Keely Portway looks at some of the latest advances in light-based test and measurement techniques
Five Axis
14 September 2017
Sensofar Metrology has announced the Five Axis, a new 3D optical profiler that combines a high-accuracy rotational module and a high-resolution translation platform, together with advanced inspection and analysis capabilities
S onix
25 April 2016
Sensofar Metrology has released a new high-speed non-contact 3D surface sensor, the S onix
S lynx
22 February 2016
Sensofar Metrology has released a new high-resolution non-contact 3D surface profiler in a more compact format - the S lynx
S mart
14 May 2015
Sensofar Metrology has released a new high-resolution 3D optical sensor system, the S mart. The new system is ideally suited for integration into automated production systems, in particular for inline process measurement and process control tasks
