Sensofar Metrology
Sensofar Metrology (booth 3404) will demonstrate its 3rd generation non-contact 3D optical profiler microscope system, the S neox, which has been purposely-designed for sub-nano, nano and micro-scale measurement, with advanced inspection and analysis capabilities.
The new S neox outperforms its predecessor in terms of design, functionality, efficiency and performance. But above all, the most impressive feature to highlight is the speed. It is faster than the previous S neox and is also faster than existing optical profilers.
