The new modular BX3M series of upright microscopes from Olympus can be customised to suit any requirement – from a cost-effective workhorse to a high-end research system. The design now includes advanced illumination modes for in-depth and efficient analysis, and is ideal for use alongside the new Olympus Stream 2.1 micro-imaging software. Further facilitating operational standards and detailed inspection tasks, the new software works seamlessly with the BX3M to streamline the complete workflow, from observation through to measurement, analysis and report creation.
In addition to a vast selection of traditional illumination modes, the BX3M includes imaging techniques to enhance industrial inspection tasks, and is especially ideal for failure analysis of complex samples. To enable faster topographic and defect analysis, directional darkfield is made possible through segmented LED illumination, which provides flexible illumination from different angles. For samples with varying structures such as a PCB, Olympus MIX illumination delivers unrivalled flexibility, as directional darkfield can be combined not only with brightfield, but also with polarisation and fluorescence imaging. This enables the acquisition of colour, contrast and topographic information in one comprehensive image, making the invisible visible and benefiting a host of applications, from the analysis of composite materials to flaw inspection of semiconductors.