PRESS RELEASE

NanoCam Sq

4D Technology has introduced its NanoCam Sq dynamic profiler, an instrument for measuring surface roughness on large, polished optics and optical quality surfaces. The device replaces slow, messy replication methods required by traditional workstation interferometers. By enabling on-machine roughness metrology it reduces handling and transportation of the optic, thereby increasing throughput and dramatically reducing the risk of damage to expensive, mission-critical optics.

The NanoCam Sq uses dynamic interferometry, incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers. Because acquisition time is so short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. This freedom of positioning means that the instrument can measure any location on the surface of a large optic, and that the optic can be located anywhere, including on polishing equipment.

The NanoCam Sq dynamic profiler is a complete system including the profiler, computer system and the company's 4Sight advanced analysis software, which reports ISO 25178 surface roughness parameters and provides extensive 2D and 3D analysis options.

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