PRESS RELEASE

Photon RT spectrophotometer

EssentOptics present Photon RT spectrophotometer with new measurement features at Photonica-2015.

The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required.

The thin film polarizers are often used to separate polarization of incoming beam, e.g. laser beam. For appropriate operartion of polarizer, the light beam shall incident the surface at the Brewster angle (e.g., about 56 degrees to the normal position for BK7 glass). One of the important characteristics of thin-film polarizer is the ratio of intensities of the transmitted p-polarized radiation to the transmitted s-polarized radiation - Tp / Ts.

The higher the ratio, the better the polarizer. In practice, one must set the angle of incidence accurately in order to determine this characteristic by adjusting the angle from about 53 to 59 degrees. Such multiple measurements can be easily carried out unattended even with a 0.1 degree step using the Photon RT spectrophotometer. All measurement results will be instantly saved as Excel files for further analysis. Using the measured data, one can knowlingly determine not only the optimum angle of incidence, but also the range of angles and wav  elength ranges corresponding to the best performance characteristics of polarizer. To an even greater extent, this great feature will be useful to analyse broadband polarizers.

This group of optical elements shall demonstarte maximum reflectance within a pre-determined wavelength range. For example, a typical requirement would specify reflectance (Rs, Rp) greater than 99,9% for 975-1175 nm at 45 degrees angle of incidence. For more demanding mirrors, an additional requirement would address not only a particluar angle of incidence, but a range of angles, e.g. 40-50 degrees, or 0-45 degres. Such measurements can be successfuly performed with Photon RT spectrophotometer and would require just 15-30 minutes to complete. No involvement of optical engineer is required, all measurerments are performed unattended, so the user can invest her time in other projects or activities.

These examples show new possibilities for measurements of optical components with PHOTON RT universal scanning spectrophotometer ensuring accurate, fast and time-effiicient results.

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