McPherson’s new Spectral Test Station provides a 100mm diameter collimated and wavelength variable monochromatic light beam to illuminate, spectrally calibrate and document radiometric sensitivity and response characteristics of spectral and hyper-spectral sensors.
The Spectral Test Station (STS) delivers discrete bands of selected monochromatic light and/or scans selected spectral regions in the <200nm UV to >14μm LWIR wavelength range. Up to four turret mounted gratings ensure efficient coverage of wide spectral ranges. The gratings ‘snap-in’ feature allows gratings to be easily replaced, and broad or narrow band reflecting mirrors to be added.
The system is especially useful for QC testing of multiple detector chips, CCDs or focal plane arrays in a given wavelength range and for given pixel responsiveness.
The device can test direct and peripheral sensitivities of sensors with integrated optics, UV, Visible and Infrared seekers, imaging devices and spectrometers.