McPherson is pleased to announce improved optical characterization systems for spectral measurements from the vacuum ultraviolet (VUV) to the near infrared. The vacuum ultraviolet universal spectrophotometer is an optical test system optimized for emitting samples like phosphors or photo- and electro-luminescent crystals. It can measure reflectance, transmission and fluorescence emission over its complete working, 120 nanometers to 2.2 microns. Options are available to extend the range even more. The user-friendly sample chamber includes high efficiency toroidal optics for focused excitation and sensitive detection. It can operate purged or under vacuum and can interface to commercial cryogenic and heated sample mounts. Auxiliary ports are in the sample area for addition of HV leads for electrical excitation, auxiliary sample by x-ray sources or conventional lasers, and output to diverse and even fiber connected spectrometers.
- Optical Characterization (luminescence, transmission, reflection)
- Spectral Characterization (coatings, filters, photocathodes)
- Lifetimes / Persistence
- Material Science
- Energy and Efficient Lighting Research
- Photonics components manufacturing
McPherson vacuum ultraviolet universal spectrophotometer feature easily interchangeable five-position sample holders. Samples index while the system is under vacuum. Spectral excitation and emission wavelengths may be freely set and scanned. A high throughput monochromator with Deuterium and/or Xenon source provides tunable excitation. Emission detection is CW mode; lifetime (persistence) signal acquisition modules are available. For high sensitivity detection the system uses cooled photomultiplier and/or direct detection CCD array detectors.
The VUV universal spectrophotometer can operate purged or under vacuum depending on the nature of the measurement. It readily interfaces to commercial cryogenic and heated sample mounts. These single sample mounts allow measurements vs. temperature or at set temperatures as low as liquid Helium and as high as 300 degrees Kelvin. Additional provisions exist to add electrical or high voltage for electrical sample probe or excitation. By flexible design, you can illuminate samples with x-ray sources or lasers, and direct output to diverse and even fiber connected spectrometers.