Hamamatsu Photonics has developed a system for high-speed inspection of micro-LEDs on wafers to detect abnormalities in their external appearance, intensity and wavelength.
The MiNY PL inspection system uses a photoluminescence measurement technique, based on Hamamatsu’s advanced image processing technology, and a newly developed imaging module. The system makes fast pass/fail decisions when inspecting micro-LEDs, which will help increase product yield in display applications, and also raise R&D efficiency of micro-LEDs.
The MiNY PL will streamline the 100 per cent inspection process of micro-LEDs in future mass-production lines.