Park Systems acquires Lyncée Tec to enhance optical metrology portfolio
Lyncée Tec's hologram technology can collect 3D information without scanning, working 100 times faster than conventional interferometry-based optical profiling (Image: Park Systems)
The acquisition positions Park Systems to broaden its expertise and further its leadership in nanoscale metrology, particularly for semiconductor applications, as it looks to integrate Lyncée Tec’s DHM technology with its existing AFM offerings.
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