MM-16 NIR spectroscopic ellipsometer

Horiba has released its MM-16 NIR spectroscopic ellipsometer, designed for thin film characterisation - determining thicknesses, optical constants (n,k) and the optical bandgap of materials, using wavelengths of 515-1000nm


Horiba Jobin Yvon has released an advanced thin film characterisation platform called DeltaPsi2. The software applies to ellipsometry, polarimetry and reflectometry and controls all Horiba Jobin Yvon thin film metrology instruments.

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