Gooch & Housego installs Veeco ion beam sputtering system
5 December 2018
Veeco Instruments' Spector ion beam sputtering optical coating system has been installed at Gooch & Housego's Moorpark, California facility
Veeco Instruments
BioScope Catalyst Perfusing Stage Incubator
23 July 2010
Veeco Instruments has introduced the BioScope Catalyst Perfusing Stage Incubator to facilitate cell biology studies using simultaneous AFM and optical methods
ContourGT
14 April 2010
Veeco Instruments has introduced its ContourGT surface metrology product family, the company's 10th generation of precision, non-contact, 3D optical surface profilers
NT9080 surface metrology system
4 February 2010
Veeco Instruments has introduced the NT9080 surface metrology system, which utilises white light interferometry to measure critical surface texture non-destructively, and at greater speeds than traditional stylus instrumentation
NPFlex 3D Metrology System
24 September 2009
Veeco Instruments has released the NPFlex 3D Metrology System, for characterising surfaces previously too difficult to measure due to size or part orientation
Veeco Confocal Metrology optical profiler
20 July 2009
Veeco Instruments, a leader in scientific and industrial metrology, has launched its Veeco Confocal Metrology (VCM) optical profiler systems.
VITA module
17 November 2008
Veeco Instruments has released the Veeco Instruments Thermal Analysis (VITA) module for its line of Scanning Probe Microscopes (SPMs).
Veeco InSight 3D Atomic Force Microscope
9 January 2008
Veeco Instruments has introduced its new InSight 3D Automated Atomic Force Microscope (AFM) Platform.
