PRESS RELEASE

BeamWave CCD beam-profiler

PhaseView has released its BeamWave CCD beam-profiler for simultaneous measurement of intensity distribution and wavefront with at-pixel resolution. With no moving parts or accessories, the device performs one-shot M² measurement and calculates intensity distribution at any plane along the propagation axis. The device is compact and inexpensive, and is suitable for both CW and pulsed lasers.

From the wavefront data the device produces, Zernike analysis can be performed, the beam's astigmatism can be deduced, and low or high order aberrations can be measured precisely. Necessary adjustments in real time can be made to visualise the beam along the Z propagation axis. 2D/3D intensity profiles can be easily extracted by selecting a Z position with a slider.

Company: