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Taylor Hobson has released its new CCI MP-L, based on modern CCI interferometry technology. With 1024 x 1024 pixel array, it can provide nanometre resolution and a large FOV. Powerful software analysis tools help researchers and developers keep pace with the latest developments whist also enabling high speed and high quality process control.  It utilizes closed loop piezoless Z axis scanner to provide 500 micron vertical range. CCI MP-L also offers the upgradability to CCI MP Functionality.

Key powerful performance

  • Industry leading data quality
  • Robust design ensures low cost of ownership
  • 64-bit control and analysis software
  • Upgradability to CCI MP 

CCI MP-L is the ideal non-contact profiler for quantitative measurements of 3D form and roughness surfaces.