WITec introduced the next generation of its TrueSurface optical profilometer, which combines surface analysis and Raman spectral acquisition to enable topographic Raman imaging on rough and uneven samples.
With the TrueSurface, Raman spectra are acquired from either precisely along a surface, or at a set, user-defined distance from a surface. This makes the distribution of chemical components within the sample visible in three dimensions. Rough, inclined or irregularly-shaped samples can be investigated with the same ease as standard samples. The requirements of sample preparation can therefore be dramatically reduced.
As the TrueSurface sensor actively monitors and maintains a set distance between the objective and sample surface, its closed-loop operation can compensate for any variations during measurements with long integration times. This keeps the measurement area in focus at all times and produces sharp chemical Raman images with sub-micrometre resolution.
Investigations on pharmaceutical tablet coatings, geological samples, composite emulsions, complex semiconductor structures and many other applications can benefit from the ease of use, accelerated workflow and methodological advantages provided by the new TrueSurface.