PRESS RELEASE
Metrios/Talos/Themis
9 August 2013
FEI has introduced three new transmission electron microscopy systems for semiconductor manufacturing and scientific research
FEI
PRESS RELEASE
Correlative microscopy set
14 January 2013
FEI has released a suite of solutions for correlative light and electron microscopy
PRESS RELEASE
Versa 3D DualBeam system
11 October 2012
Instrumentation company FEI has added a UniColore (UC) monochromated electron source to its Versa 3D DualBeam system