Zygo has released the Nexview profiler, its 3D imaging and measurement system for rapid, precise, quantitative, and interactive surface metrology. This new system is suitable for both the production and scientific research markets.
The Nexview profiler is optimised for non-contact surface metrology of an extensive variety of samples and surfaces from the very smooth to the very rough. With sub-nanometre vertical resolution at all magnifications, metrologists need not sacrifice precision for changes in field of view. Using non-contact 3D technology, the system will measure fragile and transparent materials without altering the test surface. Its high speed performance, even on steep slopes up to 85 degrees, means Nexview can make faster measurements compared to magnification dependent technologies.
The Nexview profiler and its Mx software package produce extremely high fidelity surface topography maps for measuring roughness, flatness, angles, films, steps, and more. This new software platform acts as an easy-to-use single interface for system control and data analysis, providing rich interactive 3D maps, quantitative topography information, and intuitive measurement navigation.