Oriel, a brand of Newport, has introduced a new uniformity measurement tool for measuring the uniformity of irradiation at the sample plane of solar simulators. The new tool for photovoltaics is equipped with a single metal test plate, compatible with English/metric table mounts and with all three test standards - IEC, ASTM and JIS. A detector head is provided with appropriate masking to the area defined by either the IEC or the JIS method, depending on the model. The system is designed to correctly place the test detector head in 17 predetermined positions, as defined by JIS standard C8912, or in 64 equally-spaced positions, defined by IEC method 60904-9.
Oriel’s uniformity measurement tool assists in alignment to provide the best uniformity of irradiance after a lamp installation and/or replacement. Unique models are available for a variety of Oriel solar simulators, including the 2x2, 4x4, 6x6, and 8x8 products. Affordably priced and easy to set up, the uniformity measurement tool employs a user-friendly interface and manual test and a built-in procedure guide.
The intuitive MUMS software package provides 2D and 3D surface plots to analyse XYZ positioning of the lamp to quickly attain optimal irradiance uniformity. It also prompts the user to place the detector in the appropriate position and provides a real-time readout of percentage non-uniformity of irradiance, updated as each data point is measured. It provides 5- and 9-point survey tests for quick alignment and 17- and 64-point test modes to validate compliance to JIS or IEC standards, respectively. For added convenience, the simple USB 2.0 data acquisition board and system interfaces with a PC, eliminating the need for an external power supply.